This laser diode reliability test system has been specially designed for the qualification and test of fiber-coupled devices with maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows for the independent and precise adjustment of the temperature of each laser diode package and each laser diode chip.
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This laser diode reliability test system is a short-pulsed-compatible reliability evaluation system ideal for life-test and qualification testing.
Key Features :
Applications of this laser diode reliability test system includes any qualifications, life-test or Burn-in tests :
A dedicated programming supervisory GUI with an easy-to-use graphical interface lets the user have total control of all module functions independently.
If you are interested in a lower number of channels or a Multichannel driver with no need for reliability testing functionalities, you may consider the following product : Multi channel laser diode driver
This laser diode reliability test system includes several levels of secured data management to ensure data integrity even through power blackout. Is the most complete system coming from our wide experience in pulsed laser diode drivers such as :
This system is ideal for singlemode laser diode reliability evaluation like 808 nm laser diodes, 915 nm laser diode, 976 nm laser diode, 980 nm laser diode, 1064 nm laser diode, 1550 nm laser diode or any other wavelengths. Butterfly laser diodes such as II-VI, lumentum or 3SP are perfectly well tested.
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(Note : by following this instant quote process on this shopping site, American customers can select to receive this instant quote from our US-based partner Research Lab Source. RLS offers the same price & delivery as Aerodiode and is a registered vendor in most university and government research lab purchasing)