Reliability test system for laser diode qualification in pulsed or CW regime

laser diode reliability test system

Life-test and qualification test system for laser diode reliability evaluation in CW or pulsed regime down to 1 nanosecond. Up to 112 fully independent fibered devices are electrically, thermally and optically tested according to several user-programmed test scenario.

This laser diode reliability test system has been specially designed for the qualification and test  of  fiber-coupled devices with maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows for the independent and precise adjustment of the temperature of each laser diode package and each laser diode chip.

100 000

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laser diode reliability test system
Exemple of a 5 ns pulse reaching 4 A peak current in ~1 ns

This laser diode reliability test system is a short-pulsed-compatible reliability evaluation system ideal for life-test and qualification testing.

Key Features : 

  • From CW (Continuous Wave) down to less than 1 ns pulse width
  • CW-LIV and Pulsed-LIV testing to avoid thermal effects
  • 100% independent behavior of each laser diode
  • Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.)
  • Embedded flash memory in each tray of 8 laser diodes
  • Programming supervisory GUI with easy-to-use graphical interface
  • Full laser protection with special protective window

 

Applications of this laser diode reliability test system includes any qualifications, life-test or Burn-in tests :

  • In parallel with the production process for R&D and Qualification teams
  • At the end of the laser diode production process
  • After the production when considering applications requiring high reliability levels, like aerospace, nuclear plants etc.

A dedicated programming supervisory GUI with an easy-to-use graphical interface lets the user have total control of all module functions independently.

If you are interested in a lower number of channels or a Multichannel driver with no need for reliability testing functionalities, you may consider the following product : Multi channel laser diode driver

This laser diode reliability test system includes several levels of secured data management to ensure data integrity even through power blackout. Is the most complete system coming from our wide experience in pulsed laser diode drivers such as :

 

This system is ideal for singlemode laser diode reliability evaluation like  808 nm laser diodes, 915 nm laser diode976 nm laser diode980 nm laser diode1064 nm laser diode1550 nm laser diode or any other wavelengths. Butterfly laser diodes such as II-VI, lumentum or 3SP are perfectly well tested.

CapacityUp to 112 fibered devices
Diode chip temperature range10 - 55 °C
Diode package temperature range20 - 85 °C
Temperature stability (Typ)< 1 mK
Control loopACC, APC, LIV
Current range (CW)1 - 2500 mA
Current range (Pulsed peak current)1 - 4000 mA
Pulse duration0.5 ns to CW
Compliance voltage (adjustable by user)1 - 24 V
Pulse overshoot (adjustable by user)Down to 0 %
BFM / Ext photodiode measurementYes / Yes
Internal CW LIV / Pulsed LIVYes / Yes (provisional)
Current modulationExyernal or internal : sin /sqr / triang
Driver types100 % individual setpoints and test scenarios
Laser drive current setpoint resolutionDown to 25 µA
Laser drive current stability< 0.1 mA
Internal embedded memory (per tray of 8 laser diodes)50 Go
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laser diode reliability test system
Pulse and CW complete system
Pulse and CW laser diode reliability test system. Contact us for details and customization - price order of magnitudes is only indicative here for a minimum number of laser diodes.
100 000
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(Note : by following this instant quote process on this shopping site, American customers can select to receive this instant quote from our US-based partner Research Lab Source. RLS offers the same price & delivery as Aerodiode and is a registered vendor in most university and government research lab purchasing)